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Unité Matériaux et Transformations
CNRS UMR 8207 - Université de Lille

Unité Matériaux et Transformations
CNRS UMR 8207 - Université de Lille
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Unité Matériaux et Transformations
CNRS UMR 8207 - Université de Lille
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De La Peña Francisco
Francisco De La Peña
Maître de Conférence
109
Unité Matériaux et Transformations
Bât. C6
Université Lille1
59655 Villeneuve d'Ascq
France
Tel: +33 (0) 03 20 43 46 86
Fax: +33 (0) 320 43 65 91
Courriel: Francisco.De-La-pena-manchon@univ-lille.fr
Equipe: Matériaux Terrestres et Planétaires

Recherche

Microscopie électronique, spectroscopie par perte d'énergie

Communications et séminaires récents

1 communication(s) orale(s), dont 1 invité(e)s. Liste détaillée.

Publications dans des revues internationales

  1. C. Le Guillou, S. Bernard, F. De La Pena, Y. Le Brech, XANES-based quantification of carbon functional group concentrations, Analytical Chemistry (2018) [doi: 10.1021/acs.analchem.8b00689]
  2. N. J. L. K. Davis, F. J. De La Peña, M. Tabachnyk, J. M. Richter, R. D. Lamboll, E. P. Booker, F. Wisnivesky Rocca Rivarola, J. T. Griffiths, C. Ducati, S. M. Menke, F. Deschler, N. C. Greenham, Photon Reabsorption in Mixed CsPbCl 3 :CsPbI 3 Perovskite Nanocrystal Films for Light-Emitting Diodes, The Journal of Physical Chemistry C 121 3790-3796 (2017) [doi: 10.1021/acs.jpcc.6b12828] *Note
  3. P. Torruella, R. Arenal, F. De La Peña, Z. Saghi, L. Yedra, A. Eljarrat, L. López-Conesa, M. Estrader, A. López-Ortega, G. Salazar-Alvarez, J. Nogués, C. Ducati, P. A. Midgley, F. Peiró, S. Estradé, 3D Visualization of the Iron Oxidation State in FeO/Fe 3 O 4 Core–Shell Nanocubes from Electron Energy Loss Tomography, Nano Letters 16 5068-5073 (2016) [doi: 10.1021/acs.nanolett.6b01922] *Note
  4. D. Rossouw, R. Krakow, Z. Saghi, C. S. M. Yeoh, P. Burdet, R. K. Leary, F. De La Peña, C. Ducati, C. M. F. Rae, P. A. Midgley, Blind source separation aided characterization of the γ′ strengthening phase in an advanced nickel-based superalloy by spectroscopic 4D electron microscopy, Acta Materialia 107 229-238 (2016) [doi: 10.1016/j.actamat.2016.01.042] *Note
  5. P. Moghimian, L. Harnau, V. Srot, F. De La Peña, N. Farahmand Bafi, S. J. Facey, P. A. Van Aken, Controlled self-assembly of biomolecular rods on structured substrates, Soft Matter 12 3177-3183 (2016) [doi: 10.1039/C6SM00073H] *Note
  6. G. Li, F. W. R. Rivarola, N. J. L. K. Davis, S. Bai, T. C. Jellicoe, F. De La Peña, S. Hou, C. Ducati, F. Gao, R. H. Friend, N. C. Greenham, Z. K. Tan, Highly Efficient Perovskite Nanocrystal Light-Emitting Diodes Enabled by a Universal Crosslinking Method, Advanced Materials 28 3528-3534 (2016) [doi: 10.1002/adma.201600064] *Note
  7. L. F. Zagonel, L. H. G. Tizei, G. Z. Vitiello, G. Jacopin, L. Rigutti, M. Tchernycheva, F. H. Julien, R. Songmuang, T. Ostasevicius, F. De La Peña, C. Ducati, P. A. Midgley, M. Kociak, Nanometer-scale monitoring of quantum-confined Stark effect and emission efficiency droop in multiple GaN/AlN quantum disks in nanowires, Physical Review B 93 (2016) [doi: 10.1103/PhysRevB.93.205410] *Note
  8. D. Rossouw, P. Burdet, F. De La Peña, C. Ducati, B. R. Knappett, A. E. H. Wheatley, P. A. Midgley, Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning, Nano Letters 15 2716-2720 (2015) [doi: 10.1021/acs.nanolett.5b00449] *Note
  9. R. Leary, F. De La Peña, J. S. Barnard, Y. Luo, M. Armbrüster, J. Meurig Thomas, P. A. Midgley, Revealing the Atomic Structure of Intermetallic GaPd 2 Nanocatalysts by using Aberration-Corrected Scanning Transmission Electron Microscopy, ChemCatChem 5 2599-2609 (2013) [doi: 10.1002/cctc.201300029] *Note
  10. O. Nicoletti, F. De La Peña, R. K. Leary, D. J. Holland, C. Ducati, P. A. Midgley, Three-dimensional imaging of localized surface plasmon resonances of metal nanoparticles, Nature 502 80-84 (2013) [doi: 10.1038/nature12469] *Note
  11. S. Trasobares, M. López-Haro, M. Kociak, K. March, F. De La Peña, J. A. Perez-Omil, J. J. Calvino, N. R. Lugg, D'alfonso, L. J. Allen, C. Colliex, Chemical Imaging at Atomic Resolution as a Technique To Refine the Local Structure of Nanocrystals, Angewandte Chemie International Edition 50 868-872 (2011) [doi: 10.1002/anie.201004502] *Note
  12. S. Estradé, J. M. Rebled, M. G. Walls, F. De La Peña, C. Colliex, R. Córdoba, I. C. Infante, G. Herranz, F. Sánchez, J. Fontcuberta, F. Peiró, Effect of the capping on the local Mn oxidation state in buried (001) and (110) SrTiO 3 /La 2/3 Ca 1/3 MnO 3 interfaces, Journal of Applied Physics 110 103903 (2011) [doi: 10.1063/1.3660786] *Note
  13. D. Cooper, F. De La Peña, A. Béché, J. L. Rouvière, G. Servanton, R. Pantel, P. Morin, Field Mapping with Nanometer-Scale Resolution for the Next Generation of Electronic Devices, Nano Letters 11 4585-4590 (2011) [doi: 10.1021/nl201813w] *Note
  14. F. De La Peña, M. H. Berger, J. F. Hochepied, F. Dynys, O. Stephan, M. Walls, Mapping titanium and tin oxide phases using EELS: An application of independent component analysis, Ultramicroscopy 111 169-176 (2011) [doi: 10.1016/j.ultramic.2010.10.001] *Note
  15. C. Colliex, L. Bocher, F. De La Peňa, A. Gloter, K. March, M. Walls, Atomic-scale STEM-EELS mapping across functional interfaces, JOM 62 53-57 (2010) [doi: 10.1007/s11837-010-0181-9] *Note
  16. A. M. Sanchez, A. M. Beltran, R. Beanland, T. Ben, M. H. Gass, F. De La Peña, M. Walls, A. G. Taboada, J. M. Ripalda, S. I. Molina, Blocking of indium incorporation by antimony in III–V-Sb nanostructures, Nanotechnology 21 145606 (2010) [doi: 10.1088/0957-4484/21/14/145606] *Note
  17. F. De La Peña, N. Barrett, L. F. Zagonel, M. Walls, O. Renault, Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns, Surface Science 604 1628-1636 (2010) [doi: 10.1016/j.susc.2010.06.006] *Note
  18. S. Estradé, J. Arbiol, F. Peiró, I. C. Infante, F. Sánchez, J. Fontcuberta, F. De La Peña, M. Walls, C. Colliex, Cationic and charge segregation in La2/3Ca1/3MnO3 thin films grown on (001) and (110) SrTiO3, Applied Physics Letters 93 112505 (2008) [doi: 10.1063/1.2981574] *Note
  19. R. Arenal, F. De La Peña, O. Stéphan, M. Walls, M. Tencé, A. Loiseau, C. Colliex, Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures, Ultramicroscopy 109 32-38 (2008) [doi: 10.1016/j.ultramic.2008.07.005] *Note
 
UMET - Unité Matériaux et Transformations
CNRS UMR 8207
Université de Lille
Bâtiment C6
59655 Villeneuve d'Ascq
France
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