RheoMan: a five-year, ERC-funded (Advanced Grant), project to model the rheology of the Earth's mantle

Nov 9, 2017 Titan Themis General

Today is the inaugural ceremony for the new TEM Titan Themis

At 4:10pm, presentation of P. Cordier: Plasticity under the (electron) spotlight

Invitation

Programme scientifique

 

The FEI Titan themis is a highly versatile instrument with an original full-analytical (EELS-EDX) and high resolution configuration:

 

- alignments at 80 kV, 200 kV and 300 kV

- DCOR Probe Cs corrector.

- X-FEG electron gun with monochromator. Optimum energy resolution < 0.15 eV @300 kV

- High resolution ERS 966/U GIF with duals-EELS option

- SuperX (in-lens) detector, a four quadrants, windowless Silicon Drift Detector

- FEI Precession module

- 4k x 4k CETA camera

- HAADF, BF, DF and ABF detectors for (HR)STEM imaging

- FEI Tomography software (TEM, STEM). Max. Tilt is +/_ 70 ° with dedicated tomography holder. A specific 3-axes HATA tomography holder dedicated to the tomography of dislocations is also available.

 

Four  holders are available:

- Simple tilt

- Double tilt for chemical analysis

- 3-axes HATA tomography holder,

- Gatan Cryo-transfert (N2) tomography holder

 

The microscope is designed for

 

-          STEM-EELS mapping with atomic resolution

-          STEM-EDX mapping with atomic resolution

-          HAADF and ABF imaging with atomic resolution

-          Medium resolution EDX mapping

-          TEM and STEM tomography  and oriented tomography (including EELS or EDS)

-          Local structure analysis using precession electron diffraction tomography